Tandem GCIB-ToF-SIMS and GCIB-XPS analyses of the 2-mercaptobenzothiazole on brass

Abstract Surface analysis of 2-mercaptobenzothiazole (MBTH) adsorbed on brass from 3 wt.% NaCl solution was performed by means X-ray photoelectron spectroscopy and tandem (MS/MS) time-of-flight secondary ion mass spectrometry (ToF-SIMS). These surface analytical techniques were used in association with the gas cluster beam (GCIB) sputtering method at various acceleration energies sizes, which slowly removes layer leaves chemical information intact during very thin layer. In addition, MS 1 ToF-SIMS for 2D 3D imaging to show molecular elemental distribution species. Using capability, 2 spectra clearly confirmed presence MBTH surface. Moreover, organometallic complexes indicated, formed between Cu ions released due corrosion brass. analyses based fragmentation products identified spectra.